Archive for the 'Press Releases' Category
Mar
15
Material Handling System optimizes laser cutter loading/unloading.
March 15, 2016 | Comments Off on Material Handling System optimizes laser cutter loading/unloading.
Affording complete accessibility in compact, inline footprint, larger format 4020 (6 x 12 ft material size) ByTrans Extended handles sheet thickness up to ¾ in. plate. Materials loading/unloading takes 25 sec, and cycle time, indepen…
Mar
15
Active Harmonic Filters improve power quality.
March 15, 2016 | Comments Off on Active Harmonic Filters improve power quality.
Comprised of scalable, 3- and 4-wire active harmonic filter modules/systems, Power Balance & Kxxx Series meet IEEE-519 and Mil-Std-1399 with respective values of 5% TDD and <3% THDi. Communication connections include Ethernet TCP/IP,…
Mar
15
Millimeter Wave VNA Test Cables are rated to 50 and 67 GHz.
March 15, 2016 | Comments Off on Millimeter Wave VNA Test Cables are rated to 50 and 67 GHz.
Used as durable and flexible VNA test port extenders, precision VNA test cables withstand common test lab situations. Characteristics include VSWR of 1.3:1 at 50 GHz and 1.4:1 at 67 GHz; phase stability, with flexure of ±6° at 50…
Mar
15
Solids Handling Vortex Pumps have high-temperature design.
March 15, 2016 | Comments Off on Solids Handling Vortex Pumps have high-temperature design.
Handling clear or solids-laden liquids up to 200°F, 1–10 hp SVF High Temperature/High Endurance Submersible Vortex Pumps feature (NEMA) Class R motor insulation, rated for 428°F temperature rise, and offer motor protection via oil-lubri…
Mar
15
Non-Contact Thickness Measurement Tool provides PC independence.
March 15, 2016 | Comments Off on Non-Contact Thickness Measurement Tool provides PC independence.
Able to be operated with end-user’s PC or laptop, OptiGauge® LT does not necessitate dedicated OptiGauge Controller and offers measurement range of 12 microns to 5 mm optical thickness; accuracy is ±2 microns. Flexibility to meet diverse needs, while PC independence and USB connectivity facilitate and accelerate production line integration. Suited for lab and R&D applications, tool supports various measurement probes to suit application at hand.
Mar
15
Hybrid Contactor supports high-frequency testing.
March 15, 2016 | Comments Off on Hybrid Contactor supports high-frequency testing.
Used for testing high frequency semiconductors in high-volume production, mmWave Contactor combines traditional spring probe architecture for low frequency and power I/O’s with cantilever solution for peripheral high frequency transceiver I/O&r…