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In the Ramp Light in Las Vegas: JTAG Technologies Inside – The Future of Your ATE Application with Boundary-Scan

March 16, 2016 | Comments Off on In the Ramp Light in Las Vegas: JTAG Technologies Inside – The Future of Your ATE Application with Boundary-Scan

IPC Apex 2016 – Las Vegas, Booth 2413  Eindhoven, the Netherlands — What test engineers worry about these days: the access to nodes of assemblies with ever increasing complexity is more and more difficult and results in reduced fault coverage. JTAG Technologies’ motto for Apex 2016 year reads: Optimise your ATE...
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